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		<identifier>oai:lib.psnc.pl:720</identifier>
	    <datestamp>2014-08-20T09:26:38Z</datestamp>
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<dc:creator xml:lang="pl"><![CDATA[Grubicka Joanna]]></dc:creator>
<dc:subject xml:lang="pl"><![CDATA[reliability test, Weibull distribution, Laplace transforms, renewal process]]></dc:subject>
<dc:description xml:lang="pl"><![CDATA[Poznań]]></dc:description>
<dc:description xml:lang="pl"><![CDATA[It is no exaggeration to say that the PN-IEC 61124 standard is inapplicable in many branches e.g. electronic industry. It is because PN-IEC 61124 assumes failure rate to be constant in time. This paper rejects this assumption and presents mathematical foundation of an alternative of PN-IEC 61124 applicable in electronic industry.]]></dc:description>
<dc:publisher xml:lang="pl"><![CDATA[OWN]]></dc:publisher>
<dc:date xml:lang="pl"><![CDATA[2010.06.16]]></dc:date>
<dc:date xml:lang="pl"><![CDATA[2010.09.27]]></dc:date>
<dc:date xml:lang="pl"><![CDATA[2010.06.17]]></dc:date>
<dc:date xml:lang="pl"><![CDATA[2010.04.26]]></dc:date>
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<dc:identifier><![CDATA[http://lib.psnc.pl/Content/720/10.12921_cmst.2010.16.02.135-139_Grubicka.pdf]]></dc:identifier>
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